Corn yield estimation under extreme climate stress with knowledge-encoded deep learning
Abstract
Published as:
X. Xiong,
R. Zhong,
H. Jiang,
I. Athanasiadis,
Y. Yang,
L. Zhu,
T. Lin,
Corn yield estimation under extreme climate stress with knowledge-encoded deep learning,
ISPRS Journal of Photogrammetry and Remote Sensing, 231:101-118,
2026, Elsevier, doi:10.1016/j.isprsjprs.2025.10.020.
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